ISONIC VLFS allows performing of the Vertical Line Focusing Scanning and Imaging 

The typical applications relate to theinspection of:
planar and circumferential narrow gap heavy thickness welds
ER welds
welded rails
etc
This inspection software option is available for the ISONIC 3510, ISONIC 2010, and ISONIC 2009 UPA Scope instruments and featured with:
Built-In Ray Tracer - Scanning Pattern (Scan Plan) Design
Intuitive Image Guided PA Pulser Receiver with Beam Forming View
True-To-Geometry Whole Volume / Region of INterest (ROI) Overlay Volume Corrected Imaging - Cross Sectional and Top (C-Scan)- / Side- / End- View and 3D through Sector-Scan Cross Sectional Coverage and line scanning along the desired line (for example, fusion line) either encoded or time based
DAC / TCG Data / Image Normalization
Independent on TCG Angle Gain Compensation / Gain Per Focal Law Correction
Automatic detecting of the maximal echo A-Scan among the plurarity implemented for providing of the cross-sectional material coverage
Automatic Coupling Monitor
100% Raw Data Capturing
Automatic Defects Alarming Upon C-Scan Acquisition Completed
Automatic Creation of Editable Defects List
Comprehensive Postrpocessing Toolkit Including:
Recovery and Evaluation of the Captured A-Scans from the Recorded Cross Sectional Views (Sector Scan) and C-Scans
Recovery of the Cross Sectional Views from the Recorded C-Scans
Converting Recorded C-Scans or their Segments into 3D Images
Off-Line Gain Manipulation
Off-Line DAC Normalization of the Recorded Images / DAC Evaluation
Numerous Filtering / Reject Options ( by Geometry / Position / By Amplitude db-toDAC / etc ) and Regeneration of the Corresponding of Editable Defects List and Storing it into a Separate FIle
Defects Sizing
Automatic creating of inspection reports - hard copy / PDF File

Compression wave cross-sectional coverage of the material with use of VLFS strategy combined with the RF A-Scan capturing ensures detection and distinguishing of the vertically oriented cracks and other planar sharp edges discountinuities. The said innovative modality also known as a reverse TOFD technique is based on the analysis of tip diffraction echoes providing high precision evaluation of the defects position and dimensions with use of a single probe / one side access only